S-Curve Engineering for ON-State Performance Using Anti-Ferroelectric/Ferroelectric Stack Negative-Capacitance FinFET
نویسندگان
چکیده
This work investigates the S-curve engineering by exploiting anti-ferroelectric (AFE)/ferroelectric (FE) stack negative-capacitance FinFET (NC-FinFET) to improve both subthreshold swing and ON-state current ( I ON ). The capacitance matching performance are evaluated using a short-channel AFE/FE NC-FinFET model. Our study indicates that gate-stack can theoretically achieve surprising improvements OFF-state xmlns:xlink="http://www.w3.org/1999/xlink">OFF ) relative International Roadmap for Devices Systems (IRDS) projections. There is significant long-term advantage integrated circuit (IC) power consumption speed if materials with certain AFE FE characteristics be developed introduced into IC manufacturing.
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ژورنال
عنوان ژورنال: IEEE Transactions on Electron Devices
سال: 2021
ISSN: ['0018-9383', '1557-9646']
DOI: https://doi.org/10.1109/ted.2021.3099090